FLIR Systems FLIRT5590 Infrared Camera User Manual Part 4

FLIR Systems AB Infrared Camera Part 4

User Manual Part 4

Application examples2828.3 Oxidized socket28.3.1 GeneralDepending on the type of socket and the environment in which the socket is installed, ox-ides may occur on the socket's contact surfaces. These oxides can lead to locally in-creased resistance when the socket is loaded, which can be seen in an infrared imageas local temperature increase.A socket’s construction may differ dramatically from one manufacturer to another. Forthis reason, different faults in a socket can lead to the same typical appearance in an in-frared image.Local temperature increase can also result from improper contact between a wire andsocket, or from difference in load.28.3.2 FigureThe image below shows a series of fuses where one fuse has a raised temperature onthe contact surfaces against the fuse holder. Because of the fuse holder’s blank metal,the temperature increase is not visible there, while it is visible on the fuse’s ceramicmaterial.#T559880; r. AL/45866/46124; en-US 459
Application examples2828.4 Insulation deficiencies28.4.1 GeneralInsulation deficiencies may result from insulation losing volume over the course of timeand thereby not entirely filling the cavity in a frame wall.An infrared camera allows you to see these insulation deficiencies because they eitherhave a different heat conduction property than sections with correctly installed insulation,and/or show the area where air is penetrating the frame of the building.When you are inspecting a building, the temperature difference between the inside andoutside should be at least 10°C (18°F). Studs, water pipes, concrete columns, and simi-lar components may resemble an insulation deficiency in an infrared image. Minor differ-ences may also occur naturally.28.4.2 FigureIn the image below, insulation in the roof framing is lacking. Due to the absence of insula-tion, air has forced its way into the roof structure, which thus takes on a different charac-teristic appearance in the infrared image.28.5 Draft28.5.1 GeneralDraft can be found under baseboards, around door and window casings, and above ceil-ing trim. This type of draft is often possible to see with an infrared camera, as a coolerairstream cools down the surrounding surface.When you are investigating draft in a house, there should be sub-atmospheric pressurein the house. Close all doors, windows, and ventilation ducts, and allow the kitchen fanto run for a while before you take the infrared images.An infrared image of draft often shows a typical stream pattern. You can see this streampattern clearly in the picture below.Also keep in mind that drafts can be concealed by heat from floor heating circuits.28.5.2 FigureThe image below shows a ceiling hatch where faulty installation has resulted in a strongdraft.#T559880; r. AL/45866/46124; en-US 460
Application examples28#T559880; r. AL/45866/46124; en-US 461
About FLIR Systems29FLIR Systems was established in 1978 to pioneer the development of high-performanceinfrared imaging systems, and is the world leader in the design, manufacture, and mar-keting of thermal imaging systems for a wide variety of commercial, industrial, and gov-ernment applications. Today, FLIR Systems embraces five major companies withoutstanding achievements in infrared technology since 1958—the Swedish AGEMA In-frared Systems (formerly AGA Infrared Systems), the three United States companies In-digo Systems, FSI, and Inframetrics, and the French company Cedip.Since 2007, FLIR Systems has acquired several companies with world-leading expertisein sensor technologies:• Extech Instruments (2007)• Ifara Tecnologías (2008)• Salvador Imaging (2009)• OmniTech Partners (2009)• Directed Perception (2009)• Raymarine (2010)• ICx Technologies (2010)• TackTick Marine Digital Instruments (2011)• Aerius Photonics (2011)• Lorex Technology (2012)• Traficon (2012)• MARSS (2013)• DigitalOptics micro-optics business (2013)• DVTEL (2015)• Point Grey Research (2016)• Prox Dynamics (2016)Figure 29.1 Patent documents from the early 1960sFLIR Systems has three manufacturing plants in the United States (Portland, OR, Boston,MA, Santa Barbara, CA) and one in Sweden (Stockholm). Since 2007 there is also amanufacturing plant in Tallinn, Estonia. Direct sales offices in Belgium, Brazil, China,France, Germany, Great Britain, Hong Kong, Italy, Japan, Korea, Sweden, and the USA—together with a worldwide network of agents and distributors—support our internation-al customer base.#T559880; r. AL/45866/46124; en-US 462
About FLIR Systems29FLIR Systems is at the forefront of innovation in the infrared camera industry. We antici-pate market demand by constantly improving our existing cameras and developing newones. The company has set milestones in product design and development such as theintroduction of the first battery-operated portable camera for industrial inspections, andthe first uncooled infrared camera, to mention just two innovations.Figure 29.2 1969: Thermovision Model 661. Thecamera weighed approximately 25 kg (55 lb.), theoscilloscope 20 kg (44 lb.), and the tripod 15 kg(33 lb.). The operator also needed a 220 VACgenerator set, and a 10 L (2.6 US gallon) jar withliquid nitrogen. To the left of the oscilloscope thePolaroid attachment (6 kg (13 lb.)) can be seen.Figure 29.3 2015: FLIR One, an accessory toiPhone and Android mobile phones. Weight: 90 g(3.2 oz.).FLIR Systems manufactures all vital mechanical and electronic components of the cam-era systems itself. From detector design and manufacturing, to lenses and system elec-tronics, to final testing and calibration, all production steps are carried out andsupervised by our own engineers. The in-depth expertise of these infrared specialists en-sures the accuracy and reliability of all vital components that are assembled into your in-frared camera.29.1 More than just an infrared cameraAt FLIR Systems we recognize that our job is to go beyond just producing the best infra-red camera systems. We are committed to enabling all users of our infrared camera sys-tems to work more productively by providing them with the most powerful camera–software combination. Especially tailored software for predictive maintenance, R & D,and process monitoring is developed in-house. Most software is available in a wide varie-ty of languages.We support all our infrared cameras with a wide variety of accessories to adapt yourequipment to the most demanding infrared applications.29.2 Sharing our knowledgeAlthough our cameras are designed to be very user-friendly, there is a lot more to ther-mography than just knowing how to handle a camera. Therefore, FLIR Systems hasfounded the Infrared Training Center (ITC), a separate business unit, that provides certi-fied training courses. Attending one of the ITC courses will give you a truly hands-onlearning experience.The staff of the ITC are also there to provide you with any application support you mayneed in putting infrared theory into practice.#T559880; r. AL/45866/46124; en-US 463
About FLIR Systems2929.3 Supporting our customersFLIR Systems operates a worldwide service network to keep your camera running at alltimes. If you discover a problem with your camera, local service centers have all theequipment and expertise to solve it within the shortest possible time. Therefore, there isno need to send your camera to the other side of the world or to talk to someone whodoes not speak your language.#T559880; r. AL/45866/46124; en-US 464
Terms, laws, and definitions30Term DefinitionAbsorption and emission2The capacity or ability of an object to absorb incident radi-ated energy is always the same as the capacity to emit itsown energy as radiationApparent temperature uncompensated reading from an infrared instrument, con-taining all radiation incident on the instrument, regardless ofits sources3Color palette assigns different colors to indicate specific levels of apparenttemperature. Palettes can provide high or low contrast, de-pending on the colors used in themConduction direct transfer of thermal energy from molecule to molecule,caused by collisions between the moleculesConvection heat transfer mode where a fluid is brought into motion, ei-ther by gravity or another force, thereby transferring heatfrom one place to anotherDiagnostics examination of symptoms and syndromes to determine thenature of faults or failures4Direction of heat transfer5Heat will spontaneously flow from hotter to colder, therebytransferring thermal energy from one place to another6Emissivity ratio of the power radiated by real bodies to the power that isradiated by a blackbody at the same temperature and at thesame wavelength7Energy conservation8The sum of the total energy contents in a closed system isconstantExitant radiation radiation that leaves the surface of an object, regardless ofits original sourcesHeat thermal energy that is transferred between two objects (sys-tems) due to their difference in temperatureHeat transfer rate9The heat transfer rate under steady state conditions is di-rectly proportional to the thermal conductivity of the object,the cross-sectional area of the object through which the heatflows, and the temperature difference between the two endsof the object. It is inversely proportional to the length, orthickness, of the object10Incident radiation radiation that strikes an object from its surroundingsIR thermography process of acquisition and analysis of thermal informationfrom non-contact thermal imaging devicesIsotherm replaces certain colors in the scale with a contrasting color. Itmarks an interval of equal apparent temperature11Qualitative thermography thermography that relies on the analysis of thermal patternsto reveal the existence of and to locate the position ofanomalies12Quantitative thermography thermography that uses temperature measurement to deter-mine the seriousness of an anomaly, in order to establish re-pair priorities12#T559880; r. AL/45866/46124; en-US 4652. Kirchhoff’s law of thermal radiation.3. Based on ISO 18434-1:2008 (en).4. Based on ISO 13372:2004 (en).5. 2nd law of thermodynamics.6. This is a consequence of the 2nd law of thermodynamics, the law itself is more complicated.7. Based on ISO 16714-3:2016 (en).8. 1st law of thermodynamics.9. Fourier’s law.10.This is the one-dimensional form of Fourier’s law, valid for steady-state conditions.11.Based on ISO 18434-1:2008 (en)12.Based on ISO 10878-2013 (en).
Terms, laws, and definitions30Term DefinitionRadiative heat transfer Heat transfer by the emission and absorption of thermalradiationReflected apparent temperature apparent temperature of the environment that is reflected bythe target into the IR camera13Spatial resolution ability of an IR camera to resolve small objects or detailsTemperature measure of the average kinetic energy of the molecules andatoms that make up the substanceThermal energy total kinetic energy of the molecules that make up theobject14Thermal gradient gradual change in temperature over distance13Thermal tuning process of putting the colors of the image on the object ofanalysis, in order to maximize contrast#T559880; r. AL/45866/46124; en-US 46613.Based on ISO 16714-3:2016 (en).14.Thermal energy is part of the internal energy of an object.
Thermographic measurementtechniques3131.1 IntroductionAn infrared camera measures and images the emitted infrared radiation from an object.The fact that radiation is a function of object surface temperature makes it possible forthe camera to calculate and display this temperature.However, the radiation measured by the camera does not only depend on the tempera-ture of the object but is also a function of the emissivity. Radiation also originates fromthe surroundings and is reflected in the object. The radiation from the object and the re-flected radiation will also be influenced by the absorption of the atmosphere.To measure temperature accurately, it is therefore necessary to compensate for the ef-fects of a number of different radiation sources. This is done on-line automatically by thecamera. The following object parameters must, however, be supplied for the camera:• The emissivity of the object• The reflected apparent temperature• The distance between the object and the camera• The relative humidity• Temperature of the atmosphere31.2 EmissivityThe most important object parameter to set correctly is the emissivity which, in short, is ameasure of how much radiation is emitted from the object, compared to that from a per-fect blackbody of the same temperature.Normally, object materials and surface treatments exhibit emissivity ranging from approx-imately 0.1 to 0.95. A highly polished (mirror) surface falls below 0.1, while an oxidizedor painted surface has a higher emissivity. Oil-based paint, regardless of color in the visi-ble spectrum, has an emissivity over 0.9 in the infrared. Human skin exhibits an emissiv-ity 0.97 to 0.98.Non-oxidized metals represent an extreme case of perfect opacity and high reflexivity,which does not vary greatly with wavelength. Consequently, the emissivity of metals islow – only increasing with temperature. For non-metals, emissivity tends to be high, anddecreases with temperature.31.2.1 Finding the emissivity of a sample31.2.1.1 Step 1: Determining reflected apparent temperatureUse one of the following two methods to determine reflected apparent temperature:#T559880; r. AL/45866/46124; en-US 467
Thermographic measurement techniques3131.2.1.1.1 Method 1: Direct methodFollow this procedure:1. Look for possible reflection sources, considering that the incident angle = reflectionangle (a = b).Figure 31.1 1 = Reflection source2. If the reflection source is a spot source, modify the source by obstructing it using apiece if cardboard.Figure 31.2 1 = Reflection source#T559880; r. AL/45866/46124; en-US 468
Thermographic measurement techniques313. Measure the radiation intensity (= apparent temperature) from the reflection sourceusing the following settings:• Emissivity: 1.0• Dobj: 0You can measure the radiation intensity using one of the following two methods:Figure 31.3 1 = Reflection source Figure 31.4 1 = Reflection sourceYou can not use a thermocouple to measure reflected apparent temperature, because athermocouple measures temperature, but apparent temperatrure is radiation intensity.31.2.1.1.2 Method 2: Reflector methodFollow this procedure:1. Crumble up a large piece of aluminum foil.2. Uncrumble the aluminum foil and attach it to a piece of cardboard of the same size.3. Put the piece of cardboard in front of the object you want to measure. Make sure thatthe side with aluminum foil points to the camera.4. Set the emissivity to 1.0.#T559880; r. AL/45866/46124; en-US 469
Thermographic measurement techniques315. Measure the apparent temperature of the aluminum foil and write it down. The foil isconsidered a perfect reflector, so its apparent temperature equals the reflected appa-rent temperature from the surroundings.Figure 31.5 Measuring the apparent temperature of the aluminum foil.31.2.1.2 Step 2: Determining the emissivityFollow this procedure:1. Select a place to put the sample.2. Determine and set reflected apparent temperature according to the previousprocedure.3. Put a piece of electrical tape with known high emissivity on the sample.4. Heat the sample at least 20 K above room temperature. Heating must be reasonablyeven.5. Focus and auto-adjust the camera, and freeze the image.6. Adjust Level and Span for best image brightness and contrast.7. Set emissivity to that of the tape (usually 0.97).8. Measure the temperature of the tape using one of the following measurementfunctions:•Isotherm (helps you to determine both the temperature and how evenly you haveheated the sample)•Spot (simpler)•Box Avg (good for surfaces with varying emissivity).9. Write down the temperature.10. Move your measurement function to the sample surface.11. Change the emissivity setting until you read the same temperature as your previousmeasurement.12. Write down the emissivity.Note• Avoid forced convection• Look for a thermally stable surrounding that will not generate spot reflections• Use high quality tape that you know is not transparent, and has a high emissivity youare certain of• This method assumes that the temperature of your tape and the sample surface arethe same. If they are not, your emissivity measurement will be wrong.#T559880; r. AL/45866/46124; en-US 470
Thermographic measurement techniques3131.3 Reflected apparent temperatureThis parameter is used to compensate for the radiation reflected in the object. If theemissivity is low and the object temperature relatively far from that of the reflected it willbe important to set and compensate for the reflected apparent temperature correctly.31.4 DistanceThe distance is the distance between the object and the front lens of the camera. Thisparameter is used to compensate for the following two facts:• That radiation from the target is absorbed by the atmosphere between the object andthe camera.• That radiation from the atmosphere itself is detected by the camera.31.5 Relative humidityThe camera can also compensate for the fact that the transmittance is also dependenton the relative humidity of the atmosphere. To do this set the relative humidity to the cor-rect value. For short distances and normal humidity the relative humidity can normally beleft at a default value of 50%.31.6 Other parametersIn addition, some cameras and analysis programs from FLIR Systems allow you to com-pensate for the following parameters:• Atmospheric temperature – i.e. the temperature of the atmosphere between the cam-era and the target• External optics temperature – i.e. the temperature of any external lenses or windowsused in front of the camera• External optics transmittance – i.e. the transmission of any external lenses or windowsused in front of the camera#T559880; r. AL/45866/46124; en-US 471
History of infrared technology32Before the year 1800, the existence of the infrared portion of the electromagnetic spec-trum wasn't even suspected. The original significance of the infrared spectrum, or simply‘the infrared’ as it is often called, as a form of heat radiation is perhaps less obvious to-day than it was at the time of its discovery by Herschel in 1800.Figure 32.1 Sir William Herschel (1738–1822)The discovery was made accidentally during the search for a new optical material. SirWilliam Herschel – Royal Astronomer to King George III of England, and already famousfor his discovery of the planet Uranus – was searching for an optical filter material to re-duce the brightness of the sun’s image in telescopes during solar observations. Whiletesting different samples of colored glass which gave similar reductions in brightness hewas intrigued to find that some of the samples passed very little of the sun’s heat, whileothers passed so much heat that he risked eye damage after only a few seconds’observation.Herschel was soon convinced of the necessity of setting up a systematic experiment,with the objective of finding a single material that would give the desired reduction inbrightness as well as the maximum reduction in heat. He began the experiment by ac-tually repeating Newton’s prism experiment, but looking for the heating effect rather thanthe visual distribution of intensity in the spectrum. He first blackened the bulb of a sensi-tive mercury-in-glass thermometer with ink, and with this as his radiation detector he pro-ceeded to test the heating effect of the various colors of the spectrum formed on the topof a table by passing sunlight through a glass prism. Other thermometers, placed outsidethe sun’s rays, served as controls.As the blackened thermometer was moved slowly along the colors of the spectrum, thetemperature readings showed a steady increase from the violet end to the red end. Thiswas not entirely unexpected, since the Italian researcher, Landriani, in a similar experi-ment in 1777 had observed much the same effect. It was Herschel, however, who wasthe first to recognize that there must be a point where the heating effect reaches a maxi-mum, and that measurements confined to the visible portion of the spectrum failed to lo-cate this point.Figure 32.2 Marsilio Landriani (1746–1815)Moving the thermometer into the dark region beyond the red end of the spectrum, Her-schel confirmed that the heating continued to increase. The maximum point, when hefound it, lay well beyond the red end – in what is known today as the ‘infraredwavelengths’.#T559880; r. AL/45866/46124; en-US 472
History of infrared technology32When Herschel revealed his discovery, he referred to this new portion of the electromag-netic spectrum as the ‘thermometrical spectrum’. The radiation itself he sometimes re-ferred to as ‘dark heat’, or simply ‘the invisible rays’. Ironically, and contrary to popularopinion, it wasn't Herschel who originated the term ‘infrared’. The word only began to ap-pear in print around 75 years later, and it is still unclear who should receive credit as theoriginator.Herschel’s use of glass in the prism of his original experiment led to some early contro-versies with his contemporaries about the actual existence of the infrared wavelengths.Different investigators, in attempting to confirm his work, used various types of glass in-discriminately, having different transparencies in the infrared. Through his later experi-ments, Herschel was aware of the limited transparency of glass to the newly-discoveredthermal radiation, and he was forced to conclude that optics for the infrared would prob-ably be doomed to the use of reflective elements exclusively (i.e. plane and curved mir-rors). Fortunately, this proved to be true only until 1830, when the Italian investigator,Melloni, made his great discovery that naturally occurring rock salt (NaCl) – which wasavailable in large enough natural crystals to be made into lenses and prisms – is remark-ably transparent to the infrared. The result was that rock salt became the principal infra-red optical material, and remained so for the next hundred years, until the art of syntheticcrystal growing was mastered in the 1930’s.Figure 32.3 Macedonio Melloni (1798–1854)Thermometers, as radiation detectors, remained unchallenged until 1829, the year Nobiliinvented the thermocouple. (Herschel’s own thermometer could be read to 0.2 °C(0.036 °F), and later models were able to be read to 0.05 °C (0.09 °F)). Then a break-through occurred; Melloni connected a number of thermocouples in series to form thefirst thermopile. The new device was at least 40 times as sensitive as the best thermome-ter of the day for detecting heat radiation – capable of detecting the heat from a personstanding three meters away.The first so-called ‘heat-picture’ became possible in 1840, the result of work by Sir JohnHerschel, son of the discoverer of the infrared and a famous astronomer in his own right.Based upon the differential evaporation of a thin film of oil when exposed to a heat pat-tern focused upon it, the thermal image could be seen by reflected light where the inter-ference effects of the oil film made the image visible to the eye. Sir John also managedto obtain a primitive record of the thermal image on paper, which he called a‘thermograph’.#T559880; r. AL/45866/46124; en-US 473
History of infrared technology32Figure 32.4 Samuel P. Langley (1834–1906)The improvement of infrared-detector sensitivity progressed slowly. Another major break-through, made by Langley in 1880, was the invention of the bolometer. This consisted ofa thin blackened strip of platinum connected in one arm of a Wheatstone bridge circuitupon which the infrared radiation was focused and to which a sensitive galvanometer re-sponded. This instrument is said to have been able to detect the heat from a cow at adistance of 400 meters.An English scientist, Sir James Dewar, first introduced the use of liquefied gases as cool-ing agents (such as liquid nitrogen with a temperature of –196°C (–320.8°F)) in low tem-perature research. In 1892 he invented a unique vacuum insulating container in which itis possible to store liquefied gases for entire days. The common ‘thermos bottle’, usedfor storing hot and cold drinks, is based upon his invention.Between the years 1900 and 1920, the inventors of the world ‘discovered’ the infrared.Many patents were issued for devices to detect personnel, artillery, aircraft, ships – andeven icebergs. The first operating systems, in the modern sense, began to be developedduring the 1914–18 war, when both sides had research programs devoted to the militaryexploitation of the infrared. These programs included experimental systems for enemyintrusion/detection, remote temperature sensing, secure communications, and ‘flying tor-pedo’ guidance. An infrared search system tested during this period was able to detectan approaching airplane at a distance of 1.5 km (0.94 miles), or a person more than 300meters (984 ft.) away.The most sensitive systems up to this time were all based upon variations of the bolome-ter idea, but the period between the two wars saw the development of two revolutionarynew infrared detectors: the image converter and the photon detector. At first, the imageconverter received the greatest attention by the military, because it enabled an observerfor the first time in history to literally ‘see in the dark’. However, the sensitivity of the im-age converter was limited to the near infrared wavelengths, and the most interesting mili-tary targets (i.e. enemy soldiers) had to be illuminated by infrared search beams. Sincethis involved the risk of giving away the observer’s position to a similarly-equipped enemyobserver, it is understandable that military interest in the image converter eventuallyfaded.The tactical military disadvantages of so-called 'active’ (i.e. search beam-equipped) ther-mal imaging systems provided impetus following the 1939–45 war for extensive secretmilitary infrared-research programs into the possibilities of developing ‘passive’ (nosearch beam) systems around the extremely sensitive photon detector. During this peri-od, military secrecy regulations completely prevented disclosure of the status of infrared-imaging technology. This secrecy only began to be lifted in the middle of the 1950’s, andfrom that time adequate thermal-imaging devices finally began to be available to civilianscience and industry.#T559880; r. AL/45866/46124; en-US 474
Theory of thermography3333.1 IntroductionThe subjects of infrared radiation and the related technique of thermography are still newto many who will use an infrared camera. In this section the theory behind thermographywill be given.33.2 The electromagnetic spectrumThe electromagnetic spectrum is divided arbitrarily into a number of wavelength regions,called bands, distinguished by the methods used to produce and detect the radiation.There is no fundamental difference between radiation in the different bands of the elec-tromagnetic spectrum. They are all governed by the same laws and the only differencesare those due to differences in wavelength.Figure 33.1 The electromagnetic spectrum. 1: X-ray; 2: UV; 3: Visible; 4: IR; 5: Microwaves; 6:Radiowaves.Thermography makes use of the infrared spectral band. At the short-wavelength end theboundary lies at the limit of visual perception, in the deep red. At the long-wavelengthend it merges with the microwave radio wavelengths, in the millimeter range.The infrared band is often further subdivided into four smaller bands, the boundaries ofwhich are also arbitrarily chosen. They include: the near infrared (0.75–3 μm), the middleinfrared (3–6 μm), the far infrared (6–15 μm) and the extreme infrared (15–100 μm).Although the wavelengths are given in μm (micrometers), other units are often still usedto measure wavelength in this spectral region, e.g. nanometer (nm) and Ångström (Å).The relationships between the different wavelength measurements is:33.3 Blackbody radiationA blackbody is defined as an object which absorbs all radiation that impinges on it at anywavelength. The apparent misnomer black relating to an object emitting radiation is ex-plained by Kirchhoff’s Law (after Gustav Robert Kirchhoff, 1824–1887), which states thata body capable of absorbing all radiation at any wavelength is equally capable in theemission of radiation.#T559880; r. AL/45866/46124; en-US 475
Theory of thermography33Figure 33.2 Gustav Robert Kirchhoff (1824–1887)The construction of a blackbody source is, in principle, very simple. The radiation charac-teristics of an aperture in an isotherm cavity made of an opaque absorbing material rep-resents almost exactly the properties of a blackbody. A practical application of theprinciple to the construction of a perfect absorber of radiation consists of a box that islight tight except for an aperture in one of the sides. Any radiation which then enters thehole is scattered and absorbed by repeated reflections so only an infinitesimal fractioncan possibly escape. The blackness which is obtained at the aperture is nearly equal toa blackbody and almost perfect for all wavelengths.By providing such an isothermal cavity with a suitable heater it becomes what is termedacavity radiator. An isothermal cavity heated to a uniform temperature generates black-body radiation, the characteristics of which are determined solely by the temperature ofthe cavity. Such cavity radiators are commonly used as sources of radiation in tempera-ture reference standards in the laboratory for calibrating thermographic instruments,such as a FLIR Systems camera for example.If the temperature of blackbody radiation increases to more than 525°C (977°F), thesource begins to be visible so that it appears to the eye no longer black. This is the incipi-ent red heat temperature of the radiator, which then becomes orange or yellow as thetemperature increases further. In fact, the definition of the so-called color temperature ofan object is the temperature to which a blackbody would have to be heated to have thesame appearance.Now consider three expressions that describe the radiation emitted from a blackbody.33.3.1 Planck’s lawFigure 33.3 Max Planck (1858–1947)Max Planck (1858–1947) was able to describe the spectral distribution of the radiationfrom a blackbody by means of the following formula:#T559880; r. AL/45866/46124; en-US 476
Theory of thermography33where:Wλb Blackbody spectral radiant emittance at wavelength λ.cVelocity of light = 3 × 108m/sh Planck’s constant = 6.6 × 10-34 Joule sec.kBoltzmann’s constant = 1.4 × 10-23 Joule/K.T Absolute temperature (K) of a blackbody.λ Wavelength (μm).Note The factor 10-6 is used since spectral emittance in the curves is expressed inWatt/m2, μm.Planck’s formula, when plotted graphically for various temperatures, produces a family ofcurves. Following any particular Planck curve, the spectral emittance is zero at λ = 0,then increases rapidly to a maximum at a wavelength λmax and after passing it ap-proaches zero again at very long wavelengths. The higher the temperature, the shorterthe wavelength at which maximum occurs.Figure 33.4 Blackbody spectral radiant emittance according to Planck’s law, plotted for various absolutetemperatures. 1: Spectral radiant emittance (W/cm2× 103(μm)); 2: Wavelength (μm)33.3.2 Wien’s displacement lawBy differentiating Planck’s formula with respect to λ, and finding the maximum, we have:This is Wien’s formula (after Wilhelm Wien, 1864–1928), which expresses mathemati-cally the common observation that colors vary from red to orange or yellow as the tem-perature of a thermal radiator increases. The wavelength of the color is the same as thewavelength calculated for λmax. A good approximation of the value of λmax for a givenblackbody temperature is obtained by applying the rule-of-thumb 3 000/T μm. Thus, avery hot star such as Sirius (11 000 K), emitting bluish-white light, radiates with the peakof spectral radiant emittance occurring within the invisible ultraviolet spectrum, at wave-length 0.27 μm.#T559880; r. AL/45866/46124; en-US 477
Theory of thermography33Figure 33.5 Wilhelm Wien (1864–1928)The sun (approx. 6 000 K) emits yellow light, peaking at about 0.5 μm in the middle ofthe visible light spectrum.At room temperature (300 K) the peak of radiant emittance lies at 9.7 μm, in the far infra-red, while at the temperature of liquid nitrogen (77 K) the maximum of the almost insignif-icant amount of radiant emittance occurs at 38 μm, in the extreme infrared wavelengths.Figure 33.6 Planckian curves plotted on semi-log scales from 100 K to 1000 K. The dotted line representsthe locus of maximum radiant emittance at each temperature as described by Wien's displacement law. 1:Spectral radiant emittance (W/cm2(μm)); 2: Wavelength (μm).33.3.3 Stefan-Boltzmann's lawBy integrating Planck’s formula from λ = 0 to λ = ∞, we obtain the total radiant emittance(Wb) of a blackbody:This is the Stefan-Boltzmann formula (after Josef Stefan, 1835–1893, and Ludwig Boltz-mann, 1844–1906), which states that the total emissive power of a blackbody is propor-tional to the fourth power of its absolute temperature. Graphically, Wbrepresents thearea below the Planck curve for a particular temperature. It can be shown that the radiantemittance in the interval λ = 0 to λmax is only 25% of the total, which represents about theamount of the sun’s radiation which lies inside the visible light spectrum.#T559880; r. AL/45866/46124; en-US 478
Theory of thermography33Figure 33.7 Josef Stefan (1835–1893), and Ludwig Boltzmann (1844–1906)Using the Stefan-Boltzmann formula to calculate the power radiated by the human body,at a temperature of 300 K and an external surface area of approx. 2 m2, we obtain 1 kW.This power loss could not be sustained if it were not for the compensating absorption ofradiation from surrounding surfaces, at room temperatures which do not vary too drasti-cally from the temperature of the body – or, of course, the addition of clothing.33.3.4 Non-blackbody emittersSo far, only blackbody radiators and blackbody radiation have been discussed. However,real objects almost never comply with these laws over an extended wavelength region –although they may approach the blackbody behavior in certain spectral intervals. For ex-ample, a certain type of white paint may appear perfectly white in the visible light spec-trum, but becomes distinctly gray at about 2 μm, and beyond 3 μm it is almost black.There are three processes which can occur that prevent a real object from acting like ablackbody: a fraction of the incident radiation α may be absorbed, a fraction ρ may be re-flected, and a fraction τ may be transmitted. Since all of these factors are more or lesswavelength dependent, the subscript λ is used to imply the spectral dependence of theirdefinitions. Thus:• The spectral absorptance αλ= the ratio of the spectral radiant power absorbed by anobject to that incident upon it.• The spectral reflectance ρλ= the ratio of the spectral radiant power reflected by an ob-ject to that incident upon it.• The spectral transmittance τλ= the ratio of the spectral radiant power transmittedthrough an object to that incident upon it.The sum of these three factors must always add up to the whole at any wavelength, sowe have the relation:For opaque materials τλ= 0 and the relation simplifies to:Another factor, called the emissivity, is required to describe the fraction ε of the radiantemittance of a blackbody produced by an object at a specific temperature. Thus, wehave the definition:The spectral emissivity ελ= the ratio of the spectral radiant power from an object to thatfrom a blackbody at the same temperature and wavelength.Expressed mathematically, this can be written as the ratio of the spectral emittance ofthe object to that of a blackbody as follows:Generally speaking, there are three types of radiation source, distinguished by the waysin which the spectral emittance of each varies with wavelength.• A blackbody, for which ελ= ε = 1• A graybody, for which ελ= ε = constant less than 1#T559880; r. AL/45866/46124; en-US 479
Theory of thermography33• A selective radiator, for which ε varies with wavelengthAccording to Kirchhoff’s law, for any material the spectral emissivity and spectral absorp-tance of a body are equal at any specified temperature and wavelength. That is:From this we obtain, for an opaque material (since αλ+ ρλ= 1):For highly polished materials ελapproaches zero, so that for a perfectly reflecting materi-al (i.e. a perfect mirror) we have:For a graybody radiator, the Stefan-Boltzmann formula becomes:This states that the total emissive power of a graybody is the same as a blackbody at thesame temperature reduced in proportion to the value of ε from the graybody.Figure 33.8 Spectral radiant emittance of three types of radiators. 1: Spectral radiant emittance; 2: Wave-length; 3: Blackbody; 4: Selective radiator; 5: Graybody.Figure 33.9 Spectral emissivity of three types of radiators. 1: Spectral emissivity; 2: Wavelength; 3: Black-body; 4: Graybody; 5: Selective radiator.#T559880; r. AL/45866/46124; en-US 480
Theory of thermography3333.4 Infrared semi-transparent materialsConsider now a non-metallic, semi-transparent body – let us say, in the form of a thick flatplate of plastic material. When the plate is heated, radiation generated within its volumemust work its way toward the surfaces through the material in which it is partially ab-sorbed. Moreover, when it arrives at the surface, some of it is reflected back into the inte-rior. The back-reflected radiation is again partially absorbed, but some of it arrives at theother surface, through which most of it escapes; part of it is reflected back again.Although the progressive reflections become weaker and weaker they must all be addedup when the total emittance of the plate is sought. When the resulting geometrical seriesis summed, the effective emissivity of a semi-transparent plate is obtained as:When the plate becomes opaque this formula is reduced to the single formula:This last relation is a particularly convenient one, because it is often easier to measurereflectance than to measure emissivity directly.#T559880; r. AL/45866/46124; en-US 481
The measurement formula34As already mentioned, when viewing an object, the camera receives radiation not onlyfrom the object itself. It also collects radiation from the surroundings reflected via the ob-ject surface. Both these radiation contributions become attenuated to some extent by theatmosphere in the measurement path. To this comes a third radiation contribution fromthe atmosphere itself.This description of the measurement situation, as illustrated in the figure below, is so fara fairly true description of the real conditions. What has been neglected could for in-stance be sun light scattering in the atmosphere or stray radiation from intense radiationsources outside the field of view. Such disturbances are difficult to quantify, however, inmost cases they are fortunately small enough to be neglected. In case they are not negli-gible, the measurement configuration is likely to be such that the risk for disturbance isobvious, at least to a trained operator. It is then his responsibility to modify the measure-ment situation to avoid the disturbance e.g. by changing the viewing direction, shieldingoff intense radiation sources etc.Accepting the description above, we can use the figure below to derive a formula for thecalculation of the object temperature from the calibrated camera output.Figure 34.1 A schematic representation of the general thermographic measurement situation.1: Sur-roundings; 2: Object; 3: Atmosphere; 4: CameraAssume that the received radiation power W from a blackbody source of temperatureTsource on short distance generates a camera output signal Usource that is proportional tothe power input (power linear camera). We can then write (Equation 1):or, with simplified notation:where C is a constant.Should the source be a graybody with emittance ε, the received radiation would conse-quently be εWsource.We are now ready to write the three collected radiation power terms:1. Emission from the object = ετWobj, where ε is the emittance of the object and τ is thetransmittance of the atmosphere. The object temperature is Tobj.#T559880; r. AL/45866/46124; en-US 482
The measurement formula342. Reflected emission from ambient sources = (1 – ε)τWrefl, where (1 – ε) is the reflec-tance of the object. The ambient sources have the temperature Trefl.It has here been assumed that the temperature Trefl is the same for all emitting surfa-ces within the halfsphere seen from a point on the object surface. This is of coursesometimes a simplification of the true situation. It is, however, a necessary simplifica-tion in order to derive a workable formula, and Trefl can – at least theoretically – be giv-en a value that represents an efficient temperature of a complex surrounding.Note also that we have assumed that the emittance for the surroundings = 1. This iscorrect in accordance with Kirchhoff’s law: All radiation impinging on the surroundingsurfaces will eventually be absorbed by the same surfaces. Thus the emittance = 1.(Note though that the latest discussion requires the complete sphere around the ob-ject to be considered.)3. Emission from the atmosphere = (1 – τ)τWatm, where (1 – τ) is the emittance of the at-mosphere. The temperature of the atmosphere is Tatm.The total received radiation power can now be written (Equation 2):We multiply each term by the constant C of Equation 1 and replace the CW products bythe corresponding U according to the same equation, and get (Equation 3):Solve Equation 3 for Uobj (Equation 4):This is the general measurement formula used in all the FLIR Systems thermographicequipment. The voltages of the formula are:Table 34.1 VoltagesUobj Calculated camera output voltage for a blackbody of temperatureTobj i.e. a voltage that can be directly converted into true requestedobject temperature.Utot Measured camera output voltage for the actual case.Urefl Theoretical camera output voltage for a blackbody of temperatureTrefl according to the calibration.Uatm Theoretical camera output voltage for a blackbody of temperatureTatm according to the calibration.The operator has to supply a number of parameter values for the calculation:• the object emittance ε,• the relative humidity,• Tatm• object distance (Dobj)• the (effective) temperature of the object surroundings, or the reflected ambient tem-perature Trefl, and• the temperature of the atmosphere TatmThis task could sometimes be a heavy burden for the operator since there are normallyno easy ways to find accurate values of emittance and atmospheric transmittance for theactual case. The two temperatures are normally less of a problem provided the surround-ings do not contain large and intense radiation sources.A natural question in this connection is: How important is it to know the right values ofthese parameters? It could though be of interest to get a feeling for this problem alreadyhere by looking into some different measurement cases and compare the relative#T559880; r. AL/45866/46124; en-US 483
The measurement formula34magnitudes of the three radiation terms. This will give indications about when it is impor-tant to use correct values of which parameters.The figures below illustrates the relative magnitudes of the three radiation contributionsfor three different object temperatures, two emittances, and two spectral ranges: SW andLW. Remaining parameters have the following fixed values:• τ = 0.88• Trefl = +20°C (+68°F)• Tatm = +20°C (+68°F)It is obvious that measurement of low object temperatures are more critical than measur-ing high temperatures since the ‘disturbing’ radiation sources are relatively much stron-ger in the first case. Should also the object emittance be low, the situation would be stillmore difficult.We have finally to answer a question about the importance of being allowed to use thecalibration curve above the highest calibration point, what we call extrapolation. Imaginethat we in a certain case measure Utot = 4.5 volts. The highest calibration point for thecamera was in the order of 4.1 volts, a value unknown to the operator. Thus, even if theobject happened to be a blackbody, i.e. Uobj = Utot, we are actually performing extrapola-tion of the calibration curve when converting 4.5 volts into temperature.Let us now assume that the object is not black, it has an emittance of 0.75, and the trans-mittance is 0.92. We also assume that the two second terms of Equation 4 amount to 0.5volts together. Computation of Uobj by means of Equation 4 then results in Uobj = 4.5 /0.75 / 0.92 – 0.5 = 6.0. This is a rather extreme extrapolation, particularly when consider-ing that the video amplifier might limit the output to 5 volts! Note, though, that the applica-tion of the calibration curve is a theoretical procedure where no electronic or otherlimitations exist. We trust that if there had been no signal limitations in the camera, and ifit had been calibrated far beyond 5 volts, the resulting curve would have been very muchthe same as our real curve extrapolated beyond 4.1 volts, provided the calibration algo-rithm is based on radiation physics, like the FLIR Systems algorithm. Of course theremust be a limit to such extrapolations.Figure 34.2 Relative magnitudes of radiation sources under varying measurement conditions (SW cam-era). 1: Object temperature; 2: Emittance; Obj: Object radiation; Refl: Reflected radiation; Atm: atmos-phere radiation. Fixed parameters: τ = 0.88; Trefl = 20°C (+68°F); Tatm = 20°C (+68°F).#T559880; r. AL/45866/46124; en-US 484
The measurement formula34Figure 34.3 Relative magnitudes of radiation sources under varying measurement conditions (LW cam-era). 1: Object temperature; 2: Emittance; Obj: Object radiation; Refl: Reflected radiation; Atm: atmos-phere radiation. Fixed parameters: τ = 0.88; Trefl = 20°C (+68°F); Tatm = 20°C (+68°F).#T559880; r. AL/45866/46124; en-US 485
Emissivity tables35This section presents a compilation of emissivity data from the infrared literature andmeasurements made by FLIR Systems.35.1 References1. Mikaél A. Bramson: Infrared Radiation, A Handbook for Applications, Plenum press,N.Y.2. William L. Wolfe, George J. Zissis: The Infrared Handbook, Office of Naval Research,Department of Navy, Washington, D.C.3. Madding, R. P.: Thermographic Instruments and systems. Madison, Wisconsin: Uni-versity of Wisconsin – Extension, Department of Engineering and Applied Science.4. William L. Wolfe: Handbook of Military Infrared Technology, Office of Naval Research,Department of Navy, Washington, D.C.5. Jones, Smith, Probert: External thermography of buildings..., Proc. of the Society ofPhoto-Optical Instrumentation Engineers, vol.110, Industrial and Civil Applications ofInfrared Technology, June 1977 London.6. Paljak, Pettersson: Thermography of Buildings, Swedish Building Research Institute,Stockholm 1972.7. Vlcek, J: Determination of emissivity with imaging radiometers and some emissivitiesat λ = 5 µm. Photogrammetric Engineering and Remote Sensing.8. Kern: Evaluation of infrared emission of clouds and ground as measured by weathersatellites, Defence Documentation Center, AD 617 417.9. Öhman, Claes: Emittansmätningar med AGEMA E-Box. Teknisk rapport, AGEMA1999. (Emittance measurements using AGEMA E-Box. Technical report, AGEMA1999.)10. Matteï, S., Tang-Kwor, E: Emissivity measurements for Nextel Velvet coating 811-21between –36°C AND 82°C.11. Lohrengel & Todtenhaupt (1996)12. ITC Technical publication 32.13. ITC Technical publication 29.14. Schuster, Norbert and Kolobrodov, Valentin G. Infrarotthermographie. Berlin: Wiley-VCH, 2000.Note The emissivity values in the table below are recorded using a shortwave (SW)camera. The values should be regarded as recommendations only and used withcaution.35.2 TablesTable 35.1 T: Total spectrum; SW: 2–5 µm; LW: 8–14 µm, LLW: 6.5–20 µm; 1: Material; 2: Specification;3:Temperature in °C; 4: Spectrum; 5: Emissivity: 6:Reference1 2 3 4 5 63M type 35 Vinyl electricaltape (severalcolors)< 80 LW ≈ 0.96 133M type 88 Black vinyl electri-cal tape< 105 LW ≈ 0.96 133M type 88 Black vinyl electri-cal tape< 105 MW < 0.96 133M type Super 33+Black vinyl electri-cal tape< 80 LW ≈ 0.96 13Aluminum anodized sheet 100 T 0.55 2Aluminum anodized, black,dull70 SW 0.67 9Aluminum anodized, black,dull70 LW 0.95 9#T559880; r. AL/45866/46124; en-US 486
Emissivity tables35Table 35.1 T: Total spectrum; SW: 2–5 µm; LW: 8–14 µm, LLW: 6.5–20 µm; 1: Material; 2: Specification;3:Temperature in °C; 4: Spectrum; 5: Emissivity: 6:Reference (continued)1 2 3 4 5 6Aluminum anodized, lightgray, dull70 SW 0.61 9Aluminum anodized, lightgray, dull70 LW 0.97 9Aluminum as received, plate 100 T 0.09 4Aluminum as received,sheet100 T 0.09 2Aluminum cast, blastcleaned70 SW 0.47 9Aluminum cast, blastcleaned70 LW 0.46 9Aluminum dipped in HNO3,plate100 T 0.05 4Aluminum foil 27 10 µm 0.04 3Aluminum foil 27 3 µm 0.09 3Aluminum oxidized, strongly 50–500 T 0.2–0.3 1Aluminum polished 50–100 T 0.04–0.06 1Aluminum polished plate 100 T 0.05 4Aluminum polished, sheet 100 T 0.05 2Aluminum rough surface 20–50 T 0.06–0.07 1Aluminum roughened 27 10 µm 0.18 3Aluminum roughened 27 3 µm 0.28 3Aluminum sheet, 4 samplesdifferentlyscratched70 SW 0.05–0.08 9Aluminum sheet, 4 samplesdifferentlyscratched70 LW 0.03–0.06 9Aluminum vacuumdeposited20 T 0.04 2Aluminum weathered,heavily17 SW 0.83–0.94 5Aluminum bronze 20 T 0.60 1Aluminumhydroxidepowder T 0.28 1Aluminum oxide activated, powder T 0.46 1Aluminum oxide pure, powder(alumina)T 0.16 1Asbestos board 20 T 0.96 1Asbestos fabric T 0.78 1Asbestos floor tile 35 SW 0.94 7Asbestos paper 40–400 T 0.93–0.95 1Asbestos powder T 0.40–0.60 1Asbestos slate 20 T 0.96 1Asphalt paving 4 LLW 0.967 8Brass dull, tarnished 20–350 T 0.22 1Brass oxidized 100 T 0.61 2Brass oxidized 70 SW 0.04–0.09 9#T559880; r. AL/45866/46124; en-US 487
Emissivity tables35Table 35.1 T: Total spectrum; SW: 2–5 µm; LW: 8–14 µm, LLW: 6.5–20 µm; 1: Material; 2: Specification;3:Temperature in °C; 4: Spectrum; 5: Emissivity: 6:Reference (continued)1 2 3 4 5 6Brass oxidized 70 LW 0.03–0.07 9Brass oxidized at 600°C 200–600 T 0.59–0.61 1Brass polished 200 T 0.03 1Brass polished, highly 100 T 0.03 2Brass rubbed with 80-grit emery20 T 0.20 2Brass sheet, rolled 20 T 0.06 1Brass sheet, workedwith emery20 T 0.2 1Brick alumina 17 SW 0.68 5Brick common 17 SW 0.86–0.81 5Brick Dinas silica,glazed, rough1100 T 0.85 1Brick Dinas silica,refractory1000 T 0.66 1Brick Dinas silica, un-glazed, rough1000 T 0.80 1Brick firebrick 17 SW 0.68 5Brick fireclay 1000 T 0.75 1Brick fireclay 1200 T 0.59 1Brick fireclay 20 T 0.85 1Brick masonry 35 SW 0.94 7Brick masonry,plastered20 T 0.94 1Brick red, common 20 T 0.93 2Brick red, rough 20 T 0.88–0.93 1Brick refractory,corundum1000 T 0.46 1Brick refractory,magnesite1000–1300 T 0.38 1Brick refractory,strongly radiating500–1000 T 0.8–0.9 1Brick refractory, weaklyradiating500–1000 T 0.65–0.75 1Brick silica, 95% SiO21230 T 0.66 1Brick sillimanite, 33%SiO2, 64% Al2O31500 T 0.29 1Brick waterproof 17 SW 0.87 5Bronze phosphor bronze 70 SW 0.08 9Bronze phosphor bronze 70 LW 0.06 9Bronze polished 50 T 0.1 1Bronze porous, rough 50–150 T 0.55 1Bronze powder T 0.76–0.80 1Carbon candle soot 20 T 0.95 2Carbon charcoal powder T 0.96 1Carbon graphite powder T 0.97 1#T559880; r. AL/45866/46124; en-US 488
Emissivity tables35Table 35.1 T: Total spectrum; SW: 2–5 µm; LW: 8–14 µm, LLW: 6.5–20 µm; 1: Material; 2: Specification;3:Temperature in °C; 4: Spectrum; 5: Emissivity: 6:Reference (continued)1 2 3 4 5 6Carbon graphite, filedsurface20 T 0.98 2Carbon lampblack 20–400 T 0.95–0.97 1Chipboard untreated 20 SW 0.90 6Chromium polished 50 T 0.10 1Chromium polished 500–1000 T 0.28–0.38 1Clay fired 70 T 0.91 1Cloth black 20 T 0.98 1Concrete 20 T 0.92 2Concrete dry 36 SW 0.95 7Concrete rough 17 SW 0.97 5Concrete walkway 5LLW 0.974 8Copper commercial,burnished20 T 0.07 1Copper electrolytic, care-fully polished80 T 0.018 1Copper electrolytic,polished–34 T 0.006 4Copper molten 1100–1300 T 0.13–0.15 1Copper oxidized 50 T 0.6–0.7 1Copper oxidized toblacknessT 0.88 1Copper oxidized, black 27 T 0.78 4Copper oxidized, heavily 20 T 0.78 2Copper polished 50–100 T 0.02 1Copper polished 100 T 0.03 2Copper polished,commercial27 T 0.03 4Copper polished,mechanical22 T 0.015 4Copper pure, carefullyprepared surface22 T 0.008 4Copper scraped 27 T 0.07 4Copper dioxide powder T 0.84 1Copper oxide red, powder T 0.70 1Ebonite T 0.89 1Emery coarse 80 T 0.85 1Enamel 20 T 0.9 1Enamel lacquer 20 T 0.85–0.95 1Fiber board hard, untreated 20 SW 0.85 6Fiber board masonite 70 SW 0.75 9Fiber board masonite 70 LW 0.88 9Fiber board particle board 70 SW 0.77 9Fiber board particle board 70 LW 0.89 9Fiber board porous, untreated 20 SW 0.85 6#T559880; r. AL/45866/46124; en-US 489
Emissivity tables35Table 35.1 T: Total spectrum; SW: 2–5 µm; LW: 8–14 µm, LLW: 6.5–20 µm; 1: Material; 2: Specification;3:Temperature in °C; 4: Spectrum; 5: Emissivity: 6:Reference (continued)1 2 3 4 5 6Glass pane (floatglass)non-coated 20 LW 0.97 14Gold polished 130 T 0.018 1Gold polished, carefully 200–600 T 0.02–0.03 1Gold polished, highly 100 T 0.02 2Granite polished 20 LLW 0.849 8Granite rough 21 LLW 0.879 8Granite rough, 4 differentsamples70 SW 0.95–0.97 9Granite rough, 4 differentsamples70 LW 0.77–0.87 9Gypsum 20 T 0.8–0.9 1Ice: See WaterIron and steel cold rolled 70 SW 0.20 9Iron and steel cold rolled 70 LW 0.09 9Iron and steel covered with redrust20 T 0.61–0.85 1Iron and steel electrolytic 100 T 0.05 4Iron and steel electrolytic 22 T 0.05 4Iron and steel electrolytic 260 T 0.07 4Iron and steel electrolytic, care-fully polished175–225 T 0.05–0.06 1Iron and steel freshly workedwith emery20 T 0.24 1Iron and steel ground sheet 950–1100 T 0.55–0.61 1Iron and steel heavily rustedsheet20 T 0.69 2Iron and steel hot rolled 130 T 0.60 1Iron and steel hot rolled 20 T 0.77 1Iron and steel oxidized 100 T 0.74 4Iron and steel oxidized 100 T 0.74 1Iron and steel oxidized 1227 T 0.89 4Iron and steel oxidized 125–525 T 0.78–0.82 1Iron and steel oxidized 200 T 0.79 2Iron and steel oxidized 200–600 T 0.80 1Iron and steel oxidized strongly 50 T 0.88 1Iron and steel oxidized strongly 500 T 0.98 1Iron and steel polished 100 T 0.07 2Iron and steel polished 400–1000 T 0.14–0.38 1Iron and steel polished sheet 750–1050 T 0.52–0.56 1Iron and steel rolled sheet 50 T 0.56 1Iron and steel rolled, freshly 20 T 0.24 1Iron and steel rough, planesurface50 T 0.95–0.98 1Iron and steel rusted red, sheet 22 T 0.69 4Iron and steel rusted, heavily 17 SW 0.96 5#T559880; r. AL/45866/46124; en-US 490
Emissivity tables35Table 35.1 T: Total spectrum; SW: 2–5 µm; LW: 8–14 µm, LLW: 6.5–20 µm; 1: Material; 2: Specification;3:Temperature in °C; 4: Spectrum; 5: Emissivity: 6:Reference (continued)1 2 3 4 5 6Iron and steel rusty, red 20 T 0.69 1Iron and steel shiny oxide layer,sheet,20 T 0.82 1Iron and steel shiny, etched 150 T 0.16 1Iron and steel wrought, carefullypolished40–250 T 0.28 1Iron galvanized heavily oxidized 70 SW 0.64 9Iron galvanized heavily oxidized 70 LW 0.85 9Iron galvanized sheet 92 T 0.07 4Iron galvanized sheet, burnished 30 T 0.23 1Iron galvanized sheet, oxidized 20 T 0.28 1Iron tinned sheet 24 T 0.064 4Iron, cast casting 50 T 0.81 1Iron, cast ingots 1000 T 0.95 1Iron, cast liquid 1300 T 0.28 1Iron, cast machined 800–1000 T 0.60–0.70 1Iron, cast oxidized 100 T 0.64 2Iron, cast oxidized 260 T 0.66 4Iron, cast oxidized 38 T 0.63 4Iron, cast oxidized 538 T 0.76 4Iron, cast oxidized at 600°C 200–600 T 0.64–0.78 1Iron, cast polished 200 T 0.21 1Iron, cast polished 38 T 0.21 4Iron, cast polished 40 T 0.21 2Iron, cast unworked 900–1100 T 0.87–0.95 1Krylon Ultra-flatblack 1602Flat black Room tempera-ture up to 175LW ≈ 0.96 12Krylon Ultra-flatblack 1602Flat black Room tempera-ture up to 175MW ≈ 0.97 12Lacquer 3 colors sprayedon Aluminum70 SW 0.50–0.53 9Lacquer 3 colors sprayedon Aluminum70 LW 0.92–0.94 9Lacquer Aluminum onrough surface20 T 0.4 1Lacquer bakelite 80 T 0.83 1Lacquer black, dull 40–100 T 0.96–0.98 1Lacquer black, matte 100 T 0.97 2Lacquer black, shiny,sprayed on iron20 T 0.87 1Lacquer heat–resistant 100 T 0.92 1Lacquer white 100 T 0.92 2Lacquer white 40–100 T 0.8–0.95 1Lead oxidized at 200°C 200 T 0.63 1Lead oxidized, gray 20 T 0.28 1#T559880; r. AL/45866/46124; en-US 491
Emissivity tables35Table 35.1 T: Total spectrum; SW: 2–5 µm; LW: 8–14 µm, LLW: 6.5–20 µm; 1: Material; 2: Specification;3:Temperature in °C; 4: Spectrum; 5: Emissivity: 6:Reference (continued)1 2 3 4 5 6Lead oxidized, gray 22 T 0.28 4Lead shiny 250 T 0.08 1Lead unoxidized,polished100 T 0.05 4Lead red 100 T 0.93 4Lead red, powder 100 T 0.93 1Leather tanned T 0.75–0.80 1Lime T 0.3–0.4 1Magnesium 22 T 0.07 4Magnesium 260 T 0.13 4Magnesium 538 T 0.18 4Magnesium polished 20 T 0.07 2MagnesiumpowderT 0.86 1Molybdenum 1500–2200 T 0.19–0.26 1Molybdenum 600–1000 T 0.08–0.13 1Molybdenum filament 700–2500 T 0.1–0.3 1Mortar 17 SW 0.87 5Mortar dry 36 SW 0.94 7Nextel Velvet811-21 BlackFlat black –60–150 LW > 0.97 10 and11Nichrome rolled 700 T 0.25 1Nichrome sandblasted 700 T 0.70 1Nichrome wire, clean 50 T 0.65 1Nichrome wire, clean 500–1000 T 0.71–0.79 1Nichrome wire, oxidized 50–500 T 0.95–0.98 1Nickel bright matte 122 T 0.041 4Nickel commerciallypure, polished100 T 0.045 1Nickel commerciallypure, polished200–400 T 0.07–0.09 1Nickel electrolytic 22 T 0.04 4Nickel electrolytic 260 T 0.07 4Nickel electrolytic 38 T 0.06 4Nickel electrolytic 538 T 0.10 4Nickel electroplated oniron, polished22 T 0.045 4Nickel electroplated oniron, unpolished20 T 0.11–0.40 1Nickel electroplated oniron, unpolished22 T 0.11 4Nickel electroplated,polished20 T 0.05 2Nickel oxidized 1227 T 0.85 4Nickel oxidized 200 T 0.37 2Nickel oxidized 227 T 0.37 4#T559880; r. AL/45866/46124; en-US 492
Emissivity tables35Table 35.1 T: Total spectrum; SW: 2–5 µm; LW: 8–14 µm, LLW: 6.5–20 µm; 1: Material; 2: Specification;3:Temperature in °C; 4: Spectrum; 5: Emissivity: 6:Reference (continued)1 2 3 4 5 6Nickel oxidized at 600°C 200–600 T 0.37–0.48 1Nickel polished 122 T 0.045 4Nickel wire 200–1000 T 0.1–0.2 1Nickel oxide 1000–1250 T 0.75–0.86 1Nickel oxide 500–650 T 0.52–0.59 1Oil, lubricating 0.025 mm film 20 T 0.27 2Oil, lubricating 0.050 mm film 20 T 0.46 2Oil, lubricating 0.125 mm film 20 T 0.72 2Oil, lubricating film on Ni base:Ni base only20 T 0.05 2Oil, lubricating thick coating 20 T 0.82 2Paint 8 different colorsand qualities70 SW 0.88–0.96 9Paint 8 different colorsand qualities70 LW 0.92–0.94 9Paint Aluminum, vari-ous ages50–100 T 0.27–0.67 1Paint cadmium yellow T 0.28–0.33 1Paint chrome green T 0.65–0.70 1Paint cobalt blue T 0.7–0.8 1Paint oil 17 SW 0.87 5Paint oil based, aver-age of 16 colors100 T 0.94 2Paint oil, black flat 20 SW 0.94 6Paint oil, black gloss 20 SW 0.92 6Paint oil, gray flat 20 SW 0.97 6Paint oil, gray gloss 20 SW 0.96 6Paint oil, various colors 100 T 0.92–0.96 1Paint plastic, black 20 SW 0.95 6Paint plastic, white 20 SW 0.84 6Paper 4 different colors 70 SW 0.68–0.74 9Paper 4 different colors 70 LW 0.92–0.94 9Paper black T 0.90 1Paper black, dull T 0.94 1Paper black, dull 70 SW 0.86 9Paper black, dull 70 LW 0.89 9Paper blue, dark T 0.84 1Paper coated with blacklacquerT 0.93 1Paper green T 0.85 1Paper red T 0.76 1Paper white 20 T 0.7–0.9 1Paper white bond 20 T 0.93 2Paper white, 3 differentglosses70 SW 0.76–0.78 9#T559880; r. AL/45866/46124; en-US 493
Emissivity tables35Table 35.1 T: Total spectrum; SW: 2–5 µm; LW: 8–14 µm, LLW: 6.5–20 µm; 1: Material; 2: Specification;3:Temperature in °C; 4: Spectrum; 5: Emissivity: 6:Reference (continued)1 2 3 4 5 6Paper white, 3 differentglosses70 LW 0.88–0.90 9Paper yellow T 0.72 1Plaster 17 SW 0.86 5Plaster plasterboard,untreated20 SW 0.90 6Plaster rough coat 20 T 0.91 2Plastic glass fibre lami-nate (printed circ.board)70 SW 0.94 9Plastic glass fibre lami-nate (printed circ.board)70 LW 0.91 9Plastic polyurethane iso-lation board70 LW 0.55 9Plastic polyurethane iso-lation board70 SW 0.29 9Plastic PVC, plastic floor,dull, structured70 SW 0.94 9Plastic PVC, plastic floor,dull, structured70 LW 0.93 9Platinum 100 T 0.05 4Platinum 1000–1500 T 0.14–0.18 1Platinum 1094 T 0.18 4Platinum 17 T 0.016 4Platinum 22 T 0.03 4Platinum 260 T 0.06 4Platinum 538 T 0.10 4Platinum pure, polished 200–600 T 0.05–0.10 1Platinum ribbon 900–1100 T 0.12–0.17 1Platinum wire 1400 T 0.18 1Platinum wire 500–1000 T 0.10–0.16 1Platinum wire 50–200 T 0.06–0.07 1Porcelain glazed 20 T 0.92 1Porcelain white, shiny T 0.70–0.75 1Rubber hard 20 T 0.95 1Rubber soft, gray, rough 20 T 0.95 1Sand T 0.60 1Sand 20 T 0.90 2Sandstone polished 19 LLW 0.909 8Sandstone rough 19 LLW 0.935 8Silver polished 100 T 0.03 2Silver pure, polished 200–600 T 0.02–0.03 1Skin human 32 T 0.98 2Slag boiler 0–100 T 0.97–0.93 1Slag boiler 1400–1800 T 0.69–0.67 1Slag boiler 200–500 T 0.89–0.78 1#T559880; r. AL/45866/46124; en-US 494
Emissivity tables35Table 35.1 T: Total spectrum; SW: 2–5 µm; LW: 8–14 µm, LLW: 6.5–20 µm; 1: Material; 2: Specification;3:Temperature in °C; 4: Spectrum; 5: Emissivity: 6:Reference (continued)1 2 3 4 5 6Slag boiler 600–1200 T 0.76–0.70 1Snow: See WaterSoil dry 20 T 0.92 2Soil saturated withwater20 T 0.95 2Stainless steel alloy, 8% Ni, 18%Cr500 T 0.35 1Stainless steel rolled 700 T 0.45 1Stainless steel sandblasted 700 T 0.70 1Stainless steel sheet, polished 70 SW 0.18 9Stainless steel sheet, polished 70 LW 0.14 9Stainless steel sheet, untreated,somewhatscratched70 SW 0.30 9Stainless steel sheet, untreated,somewhatscratched70 LW 0.28 9Stainless steel type 18-8, buffed 20 T 0.16 2Stainless steel type 18-8, oxi-dized at 800°C60 T 0.85 2Stucco rough, lime 10–90 T 0.91 1Styrofoam insulation 37 SW 0.60 7Tar T 0.79–0.84 1Tar paper 20 T 0.91–0.93 1Tile glazed 17 SW 0.94 5Tin burnished 20–50 T 0.04–0.06 1Tin tin–plated sheetiron100 T 0.07 2Titanium oxidized at 540°C 1000 T 0.60 1Titanium oxidized at 540°C 200 T 0.40 1Titanium oxidized at 540°C 500 T 0.50 1Titanium polished 1000 T 0.36 1Titanium polished 200 T 0.15 1Titanium polished 500 T 0.20 1Tungsten 1500–2200 T 0.24–0.31 1Tungsten 200 T 0.05 1Tungsten 600–1000 T 0.1–0.16 1Tungsten filament 3300 T 0.39 1Varnish flat 20 SW 0.93 6Varnish on oak parquetfloor70 SW 0.90 9Varnish on oak parquetfloor70 LW 0.90–0.93 9Wallpaper slight pattern,light gray20 SW 0.85 6Wallpaper slight pattern, red 20 SW 0.90 6Water distilled 20 T 0.96 2#T559880; r. AL/45866/46124; en-US 495
Emissivity tables35Table 35.1 T: Total spectrum; SW: 2–5 µm; LW: 8–14 µm, LLW: 6.5–20 µm; 1: Material; 2: Specification;3:Temperature in °C; 4: Spectrum; 5: Emissivity: 6:Reference (continued)1 2 3 4 5 6Water frost crystals –10 T 0.98 2Water ice, covered withheavy frost0 T 0.98 1Water ice, smooth 0 T 0.97 1Water ice, smooth –10 T 0.96 2Water layer >0.1 mmthick0–100 T 0.95–0.98 1Water snow T 0.8 1Water snow –10 T 0.85 2Wood 17 SW 0.98 5Wood 19 LLW 0.962 8Wood ground T 0.5–0.7 1Wood pine, 4 differentsamples70 SW 0.67–0.75 9Wood pine, 4 differentsamples70 LW 0.81–0.89 9Wood planed 20 T 0.8–0.9 1Wood planed oak 20 T 0.90 2Wood planed oak 70 SW 0.77 9Wood planed oak 70 LW 0.88 9Wood plywood, smooth,dry36 SW 0.82 7Wood plywood,untreated20 SW 0.83 6Wood white, damp 20 T 0.7–0.8 1Zinc oxidized at 400°C 400 T 0.11 1Zinc oxidized surface 1000–1200 T 0.50–0.60 1Zinc polished 200–300 T 0.04–0.05 1Zinc sheet 50 T 0.20 1#T559880; r. AL/45866/46124; en-US 496
#T559880; r. AL/45866/46124; en-US 497
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last pagePubl. No.: T559880Release: ALCommit: 45866Head: 46124Language: en-USModified: 2017-10-18Formatted: 2017-10-31Websitehttp://www.flir.comCustomer supporthttp://support.flir.comCopyright© 2017, FLIR Systems, Inc. All rights reserved worldwide.DisclaimerSpecifications subject to change without further notice. Models and accessories subject to regional market considerations. License procedures may apply.Products described herein may be subject to US Export Regulations. Please refer to exportquestions@flir.com with any questions.

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